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Magma C20 |
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A Non-Contact, Non-Destructive Next Generation Imaging tool for the Semiconductor Industry's complex devices, advanced packages, and full assemblies | |||
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Please email us at sales@neocera.com |
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Magma C30 |
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A High Resolution, Non-Destructive Current Imaging tool | |||
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Please email us at sales@neocera.com |
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Magma Scanning Service |
Neocera is now offering scanning services using Neocera's state-of-the-art Magma C20 Scanning SQUID Microscope (SSM) Imaging System. | |||
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NeoMetriK |
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Over the past few years, Neocera has developed
state-of-the-art metrology for in-line
dielectric constant and capacitance measurements of Cu/low-k
interconnect. Based on a 4 GHz near-field microwave probe capable of
spatially localized non-contact electrical measurements on test
structures as small as 20x20μm2 in the scribe
lines of production wafers, NeoMetriK provides critical information
throughout the entire BEOL integration process. NeoMetriK is an
indispensable tool for giving the competitive edge by accelerating new
process development in R&D and pilot lines, and providing for
advanced process control in wafer fabs. NeoMetriK meets the industry
need for production wafer compatible low-k metrology that is
non-destructive, non-contaminating, and provides real time data
collection and analysis. In November 2006 the NeoMetriK technology was acquired by Solid State Measurements, Inc. For more information please see http://www.ssm-inc.com/SSM_Products6300.htm |
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For More Information |
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Please email us at sales@neocera.com |
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